●002 – 2 Channel pulse function arbitrary noise generator
●330 – License for 330 Mbit/s Pattern Generation GET QUOTE
The Keysight 81160A (Agilent) Pulse Function Arbitrary Noise Generator is a high precision pulse generator enhanced with versatile signal generation, modulation and distortion capabilities that are integrated into one instrument to minimize cabling, space, and test time. It eliminates the need for cumbersome multi-instrument setups for stress testing devices. It provides versatile waveforms along with superior signals with an intrinsic jitter of 7 ps rms. This combination of characteristics helps engineers define better performance specifications for their devices. The Agilent 81160A Pulse Function Arbitrary Noise Generator is ideal for general-purpose bench tests and advanced serial data stress tests.
Features and Specifications of:
●A high precision pulse generator:
oEnhanced with versatile signal generation, modulation and distortion capabilities for:
■Accurate signals to test your device to its limits and not your signal source
■Versatile waveform and noise generation to be ready for today‘s and tomorrow‘s stress test challenges
●An arbitrary bit-shaped pattern generator:
oTo test in addition to analog, digital and mixed signal devices
oFor ideal and destorted pattern up to 600 Mbit/s
oIntegrated into one instrument to minimize cabling, space and test time
oPrecise signals for performance verification and characterization
●A function arbitrary generator:
oProvides versitile waveforms and modulation capabilities to shape the signal the DUT needs
oFor versatile signal generation to optimize testing
●A noise generator:
oCombines two required extremes, random noise and repeatable noise with very long repetition rates for simple problem identification
oTo distort signals to build up worst case scenarios
●Generation of 330-MHz pulses and 500-MHz function/arbitrary waveforms with a 2.5-GSa/s sample rate and 14-bit vertical resolution
●Selectable crest factors for white Gaussian noise lets engineers determine how much distortion to apply to a device during stress testing to meet various serial bus standards
●Glitch-free timing parameter changes allow engineers to change the frequency without drop-outs or glitches and enable continuous operation without rebooting or resetting the device under test
●Arbitrary bit patterns show capacitive load of the channels using simple pattern settings
●Complex measurement setups are no longer necessary to test designs to their limits
●Pulses 330 MHz, 500 Mhz sine waves, 660 Mbit pattern
●Can be used in many different applications including:
oNoise source for physical layer tests in communications and computer bus standards
oClock generation
oSystem trigger source
oRadar test device testing
oSignal integrity test
oNoise and jitter emulation
oEthernet
oSATA
oNanotechnology
