Product Overview
RENT KEYSIGHT E4991A (AGILENT) (call for availability)
The Keysight E4991A RF Impedance / Material analyzer offers ultimate impedance measurement performance and powerful built in analysis function. It will provide innovations in R&D of components and circuit designers who evaluate components in the range of 3 GHz. The E4991A uses an RF-IV technique, as opposed to the reflection measurement technique, for more accurate impedance measurement over wide impedance range. Basic impedance accuracy is +/-0.8%. High Q accuracy enables low-loss component analysis. The internal synthesizer sweeps frequency from 1 MHz to 3 GHz with 1 mHz resolution.
Material Evaluation: The Agilent E4991A provides the total dielectric/magnetic material measurement solutions in wide frequency range (1 MHz to 1 GHz).
On-Wafer Measurement: The Keysight E4991A-010 (Agilent), Probe Station Connection Kit, enables us to easily connect the Keysight E4991A (Agilent) to a RF probe system from Cascade Microtech for making on-wafer impedance measurements.
Temperature Characteristic Evaluation: The temperature characteristic test kit, the E4991A-007, is a new solution of temperature characteristic measurement for components and materials. This option provides highly accurate temperature characteristic analysis capability within the wide temperature range from – 55°C to + 150°C with a powerful temperature drift compensation function.
Key specifications of the Keysight E4991A RF Impedance / Material Analyzer include:
●Basic Accuracy:
o+/- 0.8 % basic accuracy
●Sweep Parameters
oFrequency: 1 MHz to 3 GHz
oOscillator level: Up to 1 dBm/0.5 Vrms/10 mArms
oDC bias level (Option E4991A-001): +/- 40V or +/- 50 mA
●More Features
oWindows-styled user interface
oBuilt-in VBA programming function
oData transfer through LAN interface
●Versatile Measurement Options
oDielectric/magnetic material measurement (Option E4991A-002)
oReliable on-wafer measurement (Option E4991A-010)
oTemperature characteristic measurement (Option E4991A-007)
