Product Overview

KEITHLEY 4200-SCS

The Keithley 4200-SCS Semiconductor Characterization System performs lab grade DC and pulse device characterization, real-time plotting, and analysis with high precision and sub-fem to amp resolution. The Keithley 4200-SCS offers the most advanced capabilities available in a fully integrated characterization system, including a complete, embedded PC with Windows operating system and mass storage. Its self-documenting, point-and-click interface speeds and simplifies the process of taking data, so users can begin analyzing their results sooner. Additional features enable stress-measure capabilities suitable for a variety of reliability tests as well as provide precision measurement and high resolution with LCR meter support.

Features of the Keithley 4200 system include:

●Intuitive, point-and-click Windows®-based environment

●Unique Remote PreAmps extend the resolution of SMUs to 0.1fA

●C-V instrument makes C-V measurements as easy as DC I-V

●Pulse and pulse I-V capabilities for advanced semiconductor testing

●Scope card provides integrated scope and pulse measure functionality

●Self-contained PC provides fast test setup, powerful data analysis, graphing and printing, and on-board mass storage of test results

●Unique browser-style Project Navigator organizes tests by device type, allows access to multiple tests, and provides test sequencing and looping control

●Built-in stress/measure, looping, and data analysis for point-and-click reliability testing, including five JEDEC compliant sample tests

●Integrated support for a variety of LCR meters, Keithley switch matrix configurations, and both Keithley Series 3400 and Agilent 81110 pulse generators

●Includes software drivers for leading analytical probers

●2X 4210-SMU – Two Additional 4210-SMU High Power SMU Cards

●4X 4200-SMU – Four 4200-SMU Medium Power SMU Cards