Product Overview

The Keysight E5260A 8-Slot High Speed Measurement Mainframe lowers your cost-of-test by providing a high-speed parametric test solution for semiconductor, RFIC, and optical component testing. Key features include a modular configuration with eight slots available for plug-in modules, high-speed DC measurement of current and voltage, enhanced measurement speed for fast throughput, expanded program memory, 16 digital I/O lines for sophisticated triggering requirements, and parallel test capability.

The fast measurement speed and modular nature of the Keysight E5260A makes it an ideal choice for high-speed production test. For technologically advanced devices of today and tomorrow, the Keysight E5260A (Agilent) lowers your cost-of-test with a high-speed parametric test solution for semiconductor, RFIC, and optical component testing. The Keysight E5260A (Agilent) provides superior measurement throughput that is several times faster than earlier products. The instrument is modular, which enables customization now and provides for future expansion as requirements change. A number of innovative design elements help to improve the efficiency of complex testing, such as expanded program memory to accelerate the measurement process, and 16 digital I/O lines for sophisticated triggering requirements. Moreover, historically encountered power limitations on the instrument mainframe have been eliminated.

General Features: 

●Perform high-speed, dc parametric measurements

●Eight slots for plug-in modules

●Code compatible with 4142B

Measurement Capabilities:

●+/- 200 Volt and +/- 1 Amp output capability (HPSMU)

●+/- 100 Volt and +/- 200 milliamp output capability (MPSMU)

●4 Amp ground unit