Product Overview
RENT Keysight / Agilent 4156C Analyzer (call for availability)
The Keysight / Agilent 4156C Precision Semiconductor Parameter Analyzer provides highly accurate laboratory benchtop parameter analyzers for advanced device characterization. The superior low-current and low-voltage resolution and built-in quasi-static CV measurement capability of the Keysight / Agilent 4156C Analyzer provide a firm foundation for future expansion with other measurement instruments.
Features and Specifications of the Keysight / Agilent 4156C Analyzer include:
●Four built-in high-resolution source /monitor units, 2-voltage source units; 2-voltage monitor units
●Develops new process technologies and evaluates materials with measurements to 1 fA and 0.2 uV
●Full Kelvin; force, sense, and guard terminals for each HRSMU
●Performs quasi-static capacitance measurements versus voltage measurements
●Automatically extracts process parameters without manually manipulating screen markers
●Measures leakage characteristics with ultra-low leakage SMUs
●Automates device characterization with integrated pulse generators and selector switches
●Performs on-wafer reliability tests with built-in stressing modes
●Performs point-and-click measurements with graphical user interface
●Provides graphical data analysis capabilities with a Windows environment
●Knob sweep function verifies each probe is making contact
●Stand-by mode eliminating need for external power supplies
●Triggering modes allow synchronized AC/DC measurements
●IBASIC user functions that allows all data to be plotted and analyzed
