Product Overview
The 5-1/2 digit Keithley 6487 Picoammeter/Voltage Source improves on the measurement capability of the award-winning Keithley 6485 Picoammeter, and adds a high resolution 500V source. It provides higher accuracy and faster rise times, as well as a damping function for use with capacitive devices. With eight current measurement ranges and high speed autoranging, this cost-effective instrument can measure currents from 20fA to 20mA, take measurements at speeds up to 1000 readings per second, and source voltage from 200μV to 505V.
Features and Specifications of the Keithley 6487 Picoammeter and Voltage Source incude:
●Rear panel triax input:
oAllows the picoammeter to be used in floating operation, up to 500V
oWhen not floating, the triax to BNC adapter allows inexpensive, easy-to-use BNC cables to be used
●Built-in Trigger Link interface:
oSimplifies synchronizing with other instruments and voltage sources
oCombines six independent selectable trigger lines on a single connector for simple, direct control over all instruments in a system
●Display on/off switch, when switched off, helps avoid introducing light that could significantly reduce the accuracy of the results
●One-touch front panel design allows functions to be configured easily with the push of a button, without complicated function menus
●10fA resolution
●5-1/2 digit resolution
●<200μV burden voltage
●Alternating Voltage method ohms measurements
●Automated voltage sweeps for I-V characterization
●Floating measurements up to 500V
●Up to 1000 readings/second
●Built-in Model 486 and 487 emulation mode
●IEEE-488 and RS-232 interfaces make for easy instrument integration into automated test and measurement systems
●Scaled voltage analog output allows transmission of measurement results to devices like DMMs, data acquisition cards, oscilloscopes, or strip chart recorders
●Digital I/O
●Applications:
oResistance/resistivity measurements
oBeam monitoring and radiation monitoring
oLeakage current testing in insulators, switches, relays, and other components
oI-V characterization on semiconductor and optoelectronic devices
oFiber alignment
oCircuit test and analysis in DCLF circuits
oSensor characterization
